International Measurement and Instrument Show : photographs, 1961.

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International Measurement and Instrument Show : photographs, 1961.

http://www.worldcat.org/oclc/122398133

Images, which are identified by Pettit, include the fairgrounds where the show was held, company exhibits, and various electronic instruments.

18 photographs; black and white; 3.5 x 5 inches.25 negatives; 35 mm.

Stanford University. Department of Special Collections and University Archives

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SNAC Resource ID: 6702332

Stanford University. Department of Special Collections and University Archives

Related Entities

There are 2 Entities related to this resource.

Pettit, Joseph M. (Joseph Mayo)

http://n2t.net/ark:/99166/w6wd5gz8 (person)

Dean of the Stanford University School of Engineering, 1960-1971. From the description of International Measurement and Instrument Show : photographs, 1961. (Unknown). WorldCat record id: 122398133 Joseph Mayo Pettit (1916-1986) served as Georgia Tech's eighth President from 1972 until 1986. During World War II, Pettit was engaged in radar countermeasures development in the Radio Research Laboratory at Harvard University. His assignments included tours in India, China, Franc...

International Measurements Conference 1961 : Budapest, Hungary)

http://n2t.net/ark:/99166/w6qk40tg (corporateBody)